Flexible Electronics News

Shimadzu Introduces iSpect DIA-10 Dynamic Particle Image Analysis System

Performs particle imaging, size analysis and foreign object detection.

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By: Anthony Locicero

Copy editor, New York Post

Shimadzu Scientific Instruments (SSI) announced the release of the iSpect DIA-10 dynamic particle image analysis system, which performs particle imaging, size analysis and foreign object detection, in addition to obtaining size distributions and number concentration, in as little as two minutes.   The iSpect DIA-10 creates a user-friendly environment by automating processes such as pump operation and particle imaging according to the analysis conditions selected. Results are obtained...

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